Title :
Geometrically modified multimode interference waveguides using high refractive index SiON material, for application in wavelength multiplexing/demultiplexing
Author :
Mayeh, M. ; Farahi, F.
Author_Institution :
Center for Optoelectron. & Opt. Commun., Univ. of North Carolina, Charlotte, NC
Abstract :
Wavelength multiplexing/demultiplexing devices are considered to be one of the key elements in optical networks. Here we propose a new class of wavelength MUX/DEMUX devices which are based on change in the geometry of the multimode interference (MMI) waveguide region. This modification enables us to optimize device performances for a given set of refractive indices of core and cladding. The material of choice is SiON since it has an excellent surface morphology for the optical device application and its index of refraction can be varied from as low as 1.45 to as high as 2.5. A few designs for compact wavelength MUX/DEMUX based on off-center-fed excitement in geometrically modified MMI (GMM) are presented. Results show that modification in geometry of MMI device will lead to the better performances relative to simple MMI devices.
Keywords :
demultiplexing equipment; multiplexing equipment; optical communication equipment; optical design techniques; optical fibre networks; optical materials; optical waveguides; refractive index; silicon compounds; surface morphology; wavelength division multiplexing; SiON; geometrically modified MMI device; high-refractive index material; multimode interference waveguides; off-center-fed excitement; optical device; optical networks; surface morphology; wavelength division demultiplexing; wavelength division multiplexing; Demultiplexing; Geometrical optics; Interference; Optical fiber networks; Optical materials; Optical refraction; Optical waveguides; Refractive index; WDM networks; Waveguide transitions;
Conference_Titel :
High Capacity Optical Networks and Enabling Technologies, 2008. HONET 2008. International Symposium on
Conference_Location :
Penang
Print_ISBN :
978-1-4244-2960-8
Electronic_ISBN :
978-1-4244-2961-5
DOI :
10.1109/HONET.2008.4810221
