Impact of radiated EMI in high frequency crystal oscillator

Author

Rohde, Ulrich L. ; Poddar, Ajay K.

Author_Institution

Synergy Microwave Corp., Paterson, NJ, USA

fYear

2010

fDate

23-28 May 2010

Firstpage

992

Lastpage

995

Abstract

The high frequency (HF) crystal oscillator is susceptive to electromagnetic interference (EMI), which affects the stability or accuracy of reference frequency standards. The effect of radiated EMI can be both deterministic and random in nature that shows up as jitter in the time domain and phase noise in the frequency domain. In this paper, we studied the impact of radiated EMI in 155.6 MHz crystal oscillator (XO) and the design consideration for EMI and jitter insensitive signal sources for reference frequency standard applications.

Keywords

crystal oscillators; electromagnetic interference; electromagnetic interference; frequency 155.6 MHz; frequency domain; high frequency crystal oscillator; jitter insensitive signal sources; phase noise; radiated EMI; reference frequency standard applications; time domain; Bit error rate; Clocks; Electromagnetic interference; Frequency domain analysis; Jitter; Magnetic field measurement; Microwave oscillators; Phase noise; Printed circuits; Radio frequency; Crystal Oscillator; EMI; HF; XO;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Symposium Digest (MTT), 2010 IEEE MTT-S International

Conference_Location

Anaheim, CA

ISSN

0149-645X

Print_ISBN

978-1-4244-6056-4

Electronic_ISBN

0149-645X

Type

conf

DOI

10.1109/MWSYM.2010.5515060

Filename

5515060