DocumentCode :
3092242
Title :
An improved algorithm for performance optimal technology mapping with retiming in LUT-based FPGA design
Author :
Cong, Jason ; Wu, Chang
Author_Institution :
Dept. of Comput. Sci., California Univ., Los Angeles, CA, USA
fYear :
1996
fDate :
7-9 Oct 1996
Firstpage :
572
Lastpage :
578
Abstract :
A novel algorithm, named SeqMapII, of technology mapping with retiming for optimal clock period for K-LUT based FPGAs was recently proposed by P. Pan and C.L. Liu (1996). The time complexity of their algorithm, however, is O(K3n4 log(Kn2) log n) for sequential circuits with n gates, which is too high for medium and large size designs in practice. In this paper, we present three strategies to improve the performance of that approach:(1) efficient label update with single K-cut computation based on the monotone property of labels that we showed for sequential circuits, (2) a novel approach for the K-cut computation in partial flow networks, which are much smaller in practice, (3) SCC (strongly connected component) partition to further speedup the algorithm. In practice, our algorithm works in O(Kn3logn) time and O(Kn) space according to our experimental results. It is 2×104 times faster than SeqMapII-opt for computing optimal solutions and 2 times faster than SeqMapII-heu which uses very small expanded circuits as a heuristic
Keywords :
computational complexity; field programmable gate arrays; logic design; sequential circuits; table lookup; K-cut computation; LUT-based FPGA design; SeqMapII; monotone property; optimal clock period; partial flow networks; performance optimal technology mapping; retiming; sequential circuits; single K-cut computation; time complexity; Algorithm design and analysis; Clocks; Computer networks; Computer science; Field programmable gate arrays; Partitioning algorithms; Runtime; Sequential circuits; Space technology; Table lookup;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Design: VLSI in Computers and Processors, 1996. ICCD '96. Proceedings., 1996 IEEE International Conference on
Conference_Location :
Austin, TX
ISSN :
1063-6404
Print_ISBN :
0-8186-7554-3
Type :
conf
DOI :
10.1109/ICCD.1996.563608
Filename :
563608
Link To Document :
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