DocumentCode :
3092326
Title :
Monolithic 28.3 THz thermal image sensor incorporating 0.18-um CMOS foundry
Author :
Yang, Songping ; Su, Li ; Huang, I. ; Ting, Chih-Hung ; Tzuang, C.C.
Author_Institution :
Nat. Taiwan Univ., Taipei, Taiwan
fYear :
2010
fDate :
23-28 May 2010
Firstpage :
1
Lastpage :
1
Abstract :
This paper presents a fully monolithic approach to the design and fabrication of THz CMOS image sensor operating at 28.3 THz using the mass-producible 0.18-um 1P6M CMOS foundry. The CMOS sensor consists of antenna-coupled transducer, linearly transforming the intercepted THz (terahertz) electromagnetic energy into voltage representation. The THz image sensor adopts PTAT (Proportional To Absolute Temperature) sensing circuit configuration. The THz thermal sensor occupies 68 um × 42 um chip area. A 500 um-thick CMOS test chip of chip size 700 um × 700 um was scanned by a THz laser beam of 26 um diameter with built-in THz thermal sensors. The scanned THz thermal image of the test chip was compared with the die photo, clearly demonstrating the validity of the design concept of the proposed THz image sensor. The responsivity measured by considering the entire test chip is 6 V/W.
Keywords :
CMOS image sensors; electromagnetic waves; laser beams; monolithic integrated circuits; transducers; CMOS image sensor; PTAT sensing circuit; antenna coupled transducer; electromagnetic energy; frequency 28.3 THz; laser beam; monolithic approach; proportional to absolute temperature sensing circuit; size 0.18 mum; thermal image sensor; CMOS image sensors; Circuits; Fabrication; Foundries; Image sensors; Temperature sensors; Testing; Thermal sensors; Transducers; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest (MTT), 2010 IEEE MTT-S International
Conference_Location :
Anaheim, CA
ISSN :
0149-645X
Print_ISBN :
978-1-4244-6056-4
Electronic_ISBN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.2010.5515068
Filename :
5515068
Link To Document :
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