DocumentCode
309242
Title
CCII+ current conveyor based BIC monitor for IDDQ testing of complex CMOS circuits
Author
Stopjaková, V. ; Manhaeve, H.
Author_Institution
Dept. of Microelectron., Slovak Tech. Univ., Bratislava, Slovakia
fYear
1997
fDate
17-20 Mar 1997
Firstpage
266
Lastpage
270
Abstract
In this paper, a quiescent built-in current (BIC) monitor based on a second generation current conveyor CCII+ is presented. The monitor circuit minimises the power supply voltage degradation and provides a sensitive detection of defects that cause an elevated value of the IDDQ current The proposed monitor offers an accurate current measurement and has a wide operation range. The CCII+ based current monitor is able to handle huge digital ASICs. Significant results summarising possibilities and limitations of the circuit are discussed as well. The design was implemented through Alcatel-Mietec 0.7 μm CMOS technology and an evaluation of the prototype chips has been carried out. An experimental application of the proposed monitor in new analogue self-test structure was considered
Keywords
CMOS integrated circuits; application specific integrated circuits; built-in self test; current conveyors; electric current measurement; integrated circuit testing; 0.7 micron; Alcatel-Mietec technology; CCII+; CMOS circuit; IDDQ testing; analogue self-test structure; defect detection; digital ASIC; power supply voltage degradation; quiescent built-in current monitor; second generation current conveyor; CMOS technology; Circuit testing; Current supplies; Electronic mail; Impedance; Low voltage; Microelectronics; Monitoring; Power supplies; Switches;
fLanguage
English
Publisher
ieee
Conference_Titel
European Design and Test Conference, 1997. ED&TC 97. Proceedings
Conference_Location
Paris
ISSN
1066-1409
Print_ISBN
0-8186-7786-4
Type
conf
DOI
10.1109/EDTC.1997.582369
Filename
582369
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