Title :
CCII+ current conveyor based BIC monitor for IDDQ testing of complex CMOS circuits
Author :
Stopjaková, V. ; Manhaeve, H.
Author_Institution :
Dept. of Microelectron., Slovak Tech. Univ., Bratislava, Slovakia
Abstract :
In this paper, a quiescent built-in current (BIC) monitor based on a second generation current conveyor CCII+ is presented. The monitor circuit minimises the power supply voltage degradation and provides a sensitive detection of defects that cause an elevated value of the IDDQ current The proposed monitor offers an accurate current measurement and has a wide operation range. The CCII+ based current monitor is able to handle huge digital ASICs. Significant results summarising possibilities and limitations of the circuit are discussed as well. The design was implemented through Alcatel-Mietec 0.7 μm CMOS technology and an evaluation of the prototype chips has been carried out. An experimental application of the proposed monitor in new analogue self-test structure was considered
Keywords :
CMOS integrated circuits; application specific integrated circuits; built-in self test; current conveyors; electric current measurement; integrated circuit testing; 0.7 micron; Alcatel-Mietec technology; CCII+; CMOS circuit; IDDQ testing; analogue self-test structure; defect detection; digital ASIC; power supply voltage degradation; quiescent built-in current monitor; second generation current conveyor; CMOS technology; Circuit testing; Current supplies; Electronic mail; Impedance; Low voltage; Microelectronics; Monitoring; Power supplies; Switches;
Conference_Titel :
European Design and Test Conference, 1997. ED&TC 97. Proceedings
Conference_Location :
Paris
Print_ISBN :
0-8186-7786-4
DOI :
10.1109/EDTC.1997.582369
