• DocumentCode
    309243
  • Title

    A performance-driven placement algorithm with simultaneous Place&Route optimization for analog ICs

  • Author

    Prieto, Juan A. ; Rueda, Adoración ; Quintana, José M. ; Huertas, José L.

  • Author_Institution
    Inst. de Microelectron., Centro Nacional de Microelectron., Sevilla, Spain
  • fYear
    1997
  • fDate
    17-20 Mar 1997
  • Firstpage
    389
  • Lastpage
    394
  • Abstract
    This paper presents a performance-driven placement algorithm for automatic layout generation of analog ICs. The main innovations of our approach are essentially: (i) an integrated Place&Route optimization algorithm which is able to provide a realistic measurement of the interconnect parasitics, that is a key issue in performance-driven approaches; and (ii) the simultaneous consideration in the cost function of two levels of symmetries: global symmetry with respect to virtual axes and local symmetry affecting groups of cells. The flexibility and efficiency of the algorithm is mainly due to the use of the same slicing-tree representation for placement and global routing, and to the heuristic algorithm we propose for the global routing estimate. The feasibility of the proposed approach has been demonstrated with several practical examples
  • Keywords
    analogue integrated circuits; cellular arrays; circuit optimisation; integrated circuit interconnections; integrated circuit layout; network routing; trees (mathematics); analog ICs; automatic layout generation; cost function; global routing estimate; global symmetry; heuristic algorithm; interconnect parasitics; local symmetry; performance-driven approaches; performance-driven placement algorithm; simultaneous Place&Route optimization; slicing-tree representation; Analog integrated circuits; Augmented virtuality; Cost function; Degradation; Electronic mail; Heuristic algorithms; Integrated circuit interconnections; Iterative algorithms; Routing; Technological innovation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    European Design and Test Conference, 1997. ED&TC 97. Proceedings
  • Conference_Location
    Paris
  • ISSN
    1066-1409
  • Print_ISBN
    0-8186-7786-4
  • Type

    conf

  • DOI
    10.1109/EDTC.1997.582389
  • Filename
    582389