DocumentCode :
3092627
Title :
New method of on-sensor A/D conversion
Author :
Hamamoto, Takayuki ; Wakamatsu, Takeshi ; Aizawa, Kiyoharu
Author_Institution :
Dept. of Electr. Eng., Sci. Univ. of Tokyo, Japan
Volume :
4
fYear :
2001
fDate :
6-9 May 2001
Firstpage :
818
Abstract :
We describe a CMOS image sensor with column parallel Analog to Digital Conversion circuits. In this method, we use small 1 bit comparator which detects each bit during integration 8 bit value is determined when the integration is finished. Consequently, both the A/D conversion and the integration of the pixel value can be done in parallel. We have designed a prototype by using column parallel architecture. The prototype outputs analog value and 8 bit digital value of pixel data. It has 32×16 pixels and digital memory for each pixel. We describe the processing scheme of our ADC and the circuit and layout design of the prototype. We show results of some experiments
Keywords :
CMOS image sensors; analogue-digital conversion; parallel architectures; 16 pixel; 32 pixel; 8 bit; CMOS image sensor; analog-to-digital conversion circuit; column parallel architecture; comparator; pixel value integration; Circuit simulation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2001. ISCAS 2001. The 2001 IEEE International Symposium on
Conference_Location :
Sydney, NSW
Print_ISBN :
0-7803-6685-9
Type :
conf
DOI :
10.1109/ISCAS.2001.922363
Filename :
922363
Link To Document :
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