Title : 
Evolutionary Design of Relatively Large Combinational Circuits with an Extended Stepwise Dimension Reduction
         
        
            Author : 
Li, Zhifang ; Luo, Wenjian ; Yue, Lihua ; Wang, Xufa
         
        
            Author_Institution : 
Sch. of Comput. Sci. & Technol., Univ. of Sci. & Technol. of China, Hefei, China
         
        
        
        
        
        
            Abstract : 
In this paper, an eXtended Stepwise Dimension Reduction approach (XSDR) to evolutionary design of relatively large combinational logic circuits is proposed. In our previous work, a Stepwise Dimension Reduction approach (SDR) is introduced. The SDR divides a circuit into several layers. The layers are evolved one after another. However, some layers are difficult to be evolved. The XSDR improves the SDR by decomposing the original truth table of a layer to two truth tables. The new truth tables after decomposing are easy to be evolved. The proposed method has been tested with multipliers and the circuits taken from the Microelectronics Center of North Carolina (MCNC) benchmark library. The experimental results demonstrate that the XSDR extensively improves the performance of the SDR in terms of the number of fitness evaluations and the computational time.
         
        
            Keywords : 
combinational circuits; evolutionary computation; logic design; network synthesis; XSDR; evolutionary design; extended stepwise dimension reduction approach; large combinational logic circuits; multipliers; truth table; Assembly; Benchmark testing; Circuit testing; Combinational circuits; Computer science; Electronic circuits; Evolutionary computation; Hardware; Laboratories; Microelectronics;
         
        
        
        
            Conference_Titel : 
Dependable, Autonomic and Secure Computing, 2009. DASC '09. Eighth IEEE International Conference on
         
        
            Conference_Location : 
Chengdu
         
        
            Print_ISBN : 
978-0-7695-3929-4
         
        
            Electronic_ISBN : 
978-1-4244-5421-1
         
        
        
            DOI : 
10.1109/DASC.2009.48