Title :
ISQED 2009 conference at a glance
Abstract :
Provides a schedule of conference events and a listing of which papers were presented in each session.
Keywords :
Aging; Circuit noise; Integrated circuit noise; Libraries; Low voltage; Noise robustness; Power system modeling; Power system planning; Power system reliability; Timing;
Conference_Titel :
Quality of Electronic Design, 2009. ISQED 2009. Quality Electronic Design
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-2952-3
DOI :
10.1109/ISQED.2009.4810259
