DocumentCode :
3093060
Title :
A general piece-wise nonlinear library modeling format and size reduction technique for gate-level timing, SI, power, and variation analysis
Author :
Wang, Xin ; Kasnavi, Alireza ; Levy, Harold
Author_Institution :
Synopsys Inc., Mountain View, CA
fYear :
2009
fDate :
16-18 March 2009
Firstpage :
55
Lastpage :
61
Abstract :
Standard cell libraries are used extensively in CMOS digital circuit designs. In the past ten years, standard cell library size has increased by more than 10X. Reducing the library size is becoming a must. In this paper, we present an efficient piece-wise nonlinear library modeling format and library size reduction technique. Instead of using tables and vectors, this format uses base templates (curve or surface templates) to model the shape of curves or surfaces. It works very well for standard cells that exhibit similar behaviors. It is also efficient because the shape can be modeled by a single id. This technique can be applied to timing, SI, power, and variation modeling. It can be directly applied to the traditional nonlinear delay model (NLDM) and the recently developed current source models. This paper also presents a fast method for efficiently selecting the optimal template and detecting bad library data. Our technique uses standardized base templates and allows using any curves or shape functions as base templates. Base templates can be created as needed, and the optimal templates are selected during the model creation process. The fitting and modeling process becomes much simpler and more efficient. It avoids many difficult issues such nonlinear fitting or over-fitting. The modeling accuracy can be easily controlled. Because this format is simpler, using this format could also help speed up the calculation. Several examples are provided in this paper to show this technique is generic, robust, and efficient. Results show .lib library size can be reduced by 5~10X. Experiments using an industry-leading STA tool show the impact on accuracy is ignorable. This technique also help reduces STA tool memory usage and improves runtime.
Keywords :
CMOS digital integrated circuits; piecewise linear techniques; CMOS digital circuit designs; SI analysis; gate-level timing; general piecewise nonlinear library modeling; nonlinear delay model; power analysis; size reduction; standard cell libraries; variation analysis; CMOS digital integrated circuits; Delay; Digital circuits; Polynomials; Robustness; Runtime; Semiconductor device modeling; Shape; Software libraries; Timing; Compression; Delay Calculation; Gate-level Analysis; Library; Power; SI; Standard Cell; Variation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality of Electronic Design, 2009. ISQED 2009. Quality Electronic Design
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-2952-3
Electronic_ISBN :
978-1-4244-2953-0
Type :
conf
DOI :
10.1109/ISQED.2009.4810269
Filename :
4810269
Link To Document :
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