DocumentCode :
3093592
Title :
A Simulation-based strategy used in electrical design for reliability
Author :
Liu, Yan ; Hareland, Scott ; Hall, Donald ; Wold, Bill ; Hubing, Roger ; Mehregan, Robert ; Malka, Ronen ; Sharma, Manish ; Lane, Tom
Author_Institution :
Cardiac Rhythm Disease Manage., Medtronic, Inc., Mounds View, MN
fYear :
2009
fDate :
16-18 March 2009
Firstpage :
208
Lastpage :
212
Abstract :
A hardware electrical design for reliability process is presented that uses extensive modeling and simulation to provide key information for design, component engineering, and reliability engineering to build robust designs that demonstrate design margin, identify critical features for operations (e.g. supply chain and final test), and enable predictive reliability. The methodology integrates reliability analysis into the hardware development process, thus improving design decisions and ensuring product reliability early in the life cycle. To demonstrate the methodology, simulation environment and model infrastructure of an ICD charge and delivery circuit have been accomplished, with methods of estimating component and subsequent circuit reliability presented. Furthermore, variability-based simulations were demonstrated to understand circuit performance limits and to properly define component selection and control strategies.
Keywords :
circuit reliability; design for quality; product development; ICD charge; component engineering; critical features; delivery circuit; design for reliability; design margin; hardware development; predictive reliability; product reliability; reliability engineering; Circuit simulation; Circuit testing; Design engineering; Hardware; Integrated circuit reliability; Predictive models; Process design; Reliability engineering; Robustness; Supply chains; Simulation; design for reliability; modeling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality of Electronic Design, 2009. ISQED 2009. Quality Electronic Design
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-2952-3
Electronic_ISBN :
978-1-4244-2953-0
Type :
conf
DOI :
10.1109/ISQED.2009.4810295
Filename :
4810295
Link To Document :
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