Title :
Combinational logic SER estimation with the presence of re-convergence
Author :
Biwei Liu ; Shuming Chen ; Yi Xu
Author_Institution :
Nat. Univ. of Defense Technol., Changsha
Abstract :
As transistor feature size scales down, re-convergence takes more and more significant effect to SER (soft error rate) estimation in combinational logic. In this paper, we propose 4 forms of re-convergence in 2-input logic gates, ROR, RSUB, RAND and RXOR, and for each form the sensitization condition is presented. The results are extended to more complex gates. Based on our re-convergence analysis technique, we implement a SER analyze framework of combinational logic with re-convergence, SERAR (soft error rate analyze with re-convergence). Experiments on ISCAS´85 benchmark circuit show that re-convergence introduces average 12% ~ 41% error in SER estimation for each gate.
Keywords :
combinational circuits; logic gates; 2-input logic gates; RAND; ROR; RSUB; RXOR; SER estimation; combinational logic; complex gates; soft error rate; Acceleration; Binary decision diagrams; Circuits; Delay; Error analysis; Estimation error; Inverters; Logic gates; SPICE; Space vector pulse width modulation; BDD; SER; SET; combinational logic; re-convergence;
Conference_Titel :
Quality of Electronic Design, 2009. ISQED 2009. Quality Electronic Design
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-2952-3
Electronic_ISBN :
978-1-4244-2953-0
DOI :
10.1109/ISQED.2009.4810297