DocumentCode
3093739
Title
Application of Sun Protection Factor and Ultra Violet in Alarming Hat
Author
Lin, Yi-Sian ; Wang, Hsien-Yu ; Lee, Chang-Chi ; Shieh, Jen-Yu
Author_Institution
Nat. Taipei Univ. of Technol., Taipei
fYear
2007
fDate
5-8 Nov. 2007
Firstpage
2141
Lastpage
2145
Abstract
In this article we presented an application of sun protection factor (SPF) and ultra violet in alarming hat. In summer time most of women care about skin with the sun light condition. In order to acknowledge the sun burn extent under ultra violet (UV), a device was designed to inform people by using the MEDs, Minimal erythema dose, with different kind of race skin and different cosmetic lotion of SPF value used. However, when people with different skin type used different lotion of SPF value, the beginning total energy which could resist the ultra violet was the initial value. The harmful UV energy is accumulated under the real time UV index. As the harmful energy or UV index increase, the total energy will decrease gradually down to zero. Therefore, this alarming hat will remind people when the danger situation or energy is down to zero. By using UV spectral irradiance and erythema action spectrum, real time UV energy can be obtained. In addition, a photo sensor and amplified circuit is implemented to integrate in this system.
Keywords
biological effects of ultraviolet radiation; biomedical electronics; biomedical equipment; biomedical measurement; dosimetry; optical sensors; radiation protection; skin; sunlight; alarming hat; amplified circuit; cosmetic lotion; erythema action spectrum; harmful UV energy accumulation; minimal erythema dose; photosensor; race skin conditions; real time UV index; skin; sun burns; sun protection factor; sunlight condition; ultraviolet spectral irradiation; Antarctica; Equations; Humans; Industrial Electronics Society; Lamps; Protection; Skin; Sun; Ultra wideband technology; Wavelength measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Electronics Society, 2007. IECON 2007. 33rd Annual Conference of the IEEE
Conference_Location
Taipei
ISSN
1553-572X
Print_ISBN
1-4244-0783-4
Type
conf
DOI
10.1109/IECON.2007.4459902
Filename
4459902
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