• DocumentCode
    3093932
  • Title

    Impact of inverter interfaced distributed generation on overcurrent protection in distribution systems

  • Author

    Pan, Y. ; Ren, W. ; Ray, S. ; Walling, R. ; Reichard, M.

  • Author_Institution
    Global Res. Center, Niskayuna, NY, USA
  • Volume
    2
  • fYear
    2011
  • fDate
    8-9 Sept. 2011
  • Firstpage
    371
  • Lastpage
    376
  • Abstract
    The fault behavior of an inverter interfaced distributed generator (IIDG) is determined by its control, which is significantly different from a conventional generator. This paper examines in detail the key features of IIDG´s fault behavior with respect to interference with distribution protection. As an example, the fault behavior of a commercially available photovoltaic converter is shown through a hardware-in-the-loop (HIL) simulation using real-time digital simulator (RTDS). A case study is then performed using the HIL setup to investigate the impact of IIDG on the recloser-fuse coordination in the fuse saving mode. The results illustrate that due to fault current limiting behavior of inverters, IIDG marginally impact primary and back-up protection in a distribution system. But with high penetration level, IIDGs may disturb the recloser-fuse coordination.
  • Keywords
    distributed power generation; fault current limiters; invertors; overcurrent protection; power distribution faults; power distribution protection; distribution protection; distribution systems; fault current limiting; fuse saving mode; hardware-in-the-loop simulation; inverter interfaced distributed generator; overcurrent protection; photovoltaic converter; real-time digital simulator; recloser-fuse coordination; Circuit faults; Current control; Fault currents; Fuses; Synchronous generators; Voltage control; Inverter interfaced distributed generation; distribution systems; fuse saving; overcurrent protection; real-time simulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Engineering and Automation Conference (PEAM), 2011 IEEE
  • Conference_Location
    Wuhan
  • Print_ISBN
    978-1-4244-9691-4
  • Type

    conf

  • DOI
    10.1109/PEAM.2011.6134963
  • Filename
    6134963