Title :
1997 IEEE International Integrated Reliability Workshop Final Report (Cat. No.97TH8319)
Abstract :
The following topics were dealt with: contributors to failure; reliability test structures; designing-in reliability; wafer level reliability
Keywords :
reliability; designing-in reliability; failure; integrated reliability; reliability test structures; wafer level reliability;
Conference_Titel :
Integrated Reliability Workshop Final Report, 1997 IEEE International
Conference_Location :
Lake Tahoe, CA, USA
Print_ISBN :
0-7803-4205-4
DOI :
10.1109/IRWS.1997.660270
