DocumentCode :
3094161
Title :
Low-voltage high-speed antimonide-based compound semiconductor (ABCS) 2-μm InAs/AlSb HEMT MMIC process and its broadband switch application
Author :
Cheng-Ta Yu ; Chih-Chun Shen ; Han-Chieh Ho ; Hong-Yeh Chang ; Jia-Shiang Fu ; Heng-Kuang Lin
Author_Institution :
Dept. of Electr. Eng., Nat. Central Univ., Jhongli, Taiwan
fYear :
2012
fDate :
4-7 Dec. 2012
Firstpage :
196
Lastpage :
198
Abstract :
In this paper, we present a low-voltage highspeed antimonide-based compound semiconductor (ABCS) high electron-mobility transistor (HEMT) monolithic microwave integrated circuit (MMIC) process and its single-pole double-throw (SPDT) broadband switch application. The measured 3-dB bandwidth of the proposed SPDT switch is from dc to 30 GHz. The switch features an insertion loss of less than 4 dB, and an isolation of greater than 18 dB between 10 MHz and 30 GHz. The measured input 1 dB compression point (P1dB) and third-order intercept point (IP3) at 100 MHz are 12.5 and 27 dBm, respectively. The chip size of the proposed switch is 0.75 × 0.58 mm2. These results demonstrate the outstanding potential of ABCS HEMT technology for low voltage switch applications.
Keywords :
MMIC; aluminium compounds; high electron mobility transistors; indium compounds; microwave field effect transistors; microwave switches; ABCS HEMT technology; HEMT MMIC process; InAs-AlSb; SPDT broadband switch application; frequency 10 MHz to 30 GHz; high electron-mobility transistor monolithic microwave integrated circuit process; low-voltage high-speed antimonide-based compound semiconductor; single-pole double-throw broadband switch application; size 2 mum; third-order intercept point; HEMTs; Insertion loss; Loss measurement; MMICs; Ports (Computers); Semiconductor device measurement; Switches; antimonide-based compound semiconductor (ABCS); high electron-mobility transistor (HEMT); monolithic microwave integrated circuit (MMIC); switch;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference Proceedings (APMC), 2012 Asia-Pacific
Conference_Location :
Kaohsiung
Print_ISBN :
978-1-4577-1330-9
Electronic_ISBN :
978-1-4577-1331-6
Type :
conf
DOI :
10.1109/APMC.2012.6421544
Filename :
6421544
Link To Document :
بازگشت