Title :
An abstraction mechanism to maximize stimulus portability across RTL, FPGA, software models and silicon of SoCs
Author :
Bose, Mrinal ; Naphade, Prashant ; Bhadra, Jay ; Miller, Hillel
Abstract :
SoC verification efforts involve multiple models of the design - RTL, FPGA, silicon and software models. With increasing design complexity, re-use of tests between models is a must. In this paper, we introduce a stimulus abstraction mechanism which greatly increases the re-usability of tests across models. We then demonstrate an implementation of the abstraction mechanism on two models of a PCI-express based design. Identical tests are used to drive an RTL model via a BFM and a software model via stream sockets to achieve the same result.
Keywords :
field programmable gate arrays; integrated circuit design; silicon; system-on-chip; BFM; FPGA; PCI-express based design; RTL; SoC verification; design complexity; silicon; software models; stimulus abstraction mechanism; stimulus portability; stream sockets; Emulation; Field programmable gate arrays; Hardware design languages; Manufacturing; Microprocessors; Object oriented modeling; Silicon; Sockets; Software testing; Traffic control; SoC; emulation; silicon validation; simulation;
Conference_Titel :
Quality of Electronic Design, 2009. ISQED 2009. Quality Electronic Design
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-2952-3
Electronic_ISBN :
978-1-4244-2953-0
DOI :
10.1109/ISQED.2009.4810324