Title :
Improvement of insertion loss of band pass tunable filter using SAW resonators and GaAs diode variable capacitors
Author :
Kadota, Mitsuhiro ; Esashi, Masayoshi ; Tanaka, Shoji ; Ida, Yasutoshi ; Kimura, Tomohiro
Author_Institution :
Micro Syst. Integration Center, Tohoku Univ., Sendai, Japan
Abstract :
Tunable filters with a wide band tunable range are required for mobile phones with multi-bands and cognitive radio systems to simplify their circuits. Previously, the authors prototyped a band pass tunable filter, which continuously changes frequency from 1734 to 1844 MHz (6.1%) using surface acoustic wave (SAW) resonators and Si diode variable capacitors (varicap). However, the insertion loss was large compared with calculated one because the Q factor of the Si diode varicap was as low as 1 at 1.8 GHz. In this study, the authors improved the insertion loss of the tunable filter using GaAs varicaps. Compared with the Si varicap, the GaAs varicap has a higher Q factor of about 41 at 1.8 GHz. The authors fabricated a tunable filter composed of two SAW resonators and the GaAs varicaps instead of the Si varicaps on a printed circuit board (PCB). As a result, the insertion loss was drastically improved by 12 dB at the maximum, and the frequency characteristic approached the calculated one. The tunable range was also improved from 6.1% to 6.8%.
Keywords :
III-V semiconductors; Q-factor; UHF filters; band-pass filters; capacitors; gallium arsenide; printed circuits; semiconductor diodes; surface acoustic wave resonators; PCB; Q factor; SAW resonators; band pass tunable filter; cognitive radio systems; frequency 1734 MHz to 1844 MHz; frequency characteristic; gallium arsenide diode variable capacitors; insertion loss improvement; multiband mobile phones; printed circuit board; silicon diode variable capacitors; silicon diode varicap; surface acoustic wave resonators; Band-pass filters; Electrodes; Gallium arsenide; Resonant frequency; Resonator filters; Silicon; Surface acoustic waves; GaAs diode variable capacitor; SAW; band pass tunable filter; insertion loss;
Conference_Titel :
Ultrasonics Symposium (IUS), 2013 IEEE International
Conference_Location :
Prague
Print_ISBN :
978-1-4673-5684-8
DOI :
10.1109/ULTSYM.2013.0425