DocumentCode :
3094260
Title :
Reducing design verification cycle time through testbench redundancy
Author :
Kokrady, Aman ; Mehrotra, Rajat ; Powell, Theo J. ; Ramakrishnan, S.
Author_Institution :
APDC, Texas Instruments, Bangalore, India
fYear :
2006
fDate :
3-7 Jan. 2006
Abstract :
Design flows for modern-day system-on-chip (SoC) designs focus on reducing the design cycle time, but not on design verification time. Nearly 70% of SoC design cycle time is consumed by design verification (Raynaud, 2003). Most functional verification happens through simulation. This paper proposes a technique by which the simulation times of time consuming verification steps can be reduced. The proposed technique exploits the testbench redundancy during functional simulations to reduce simulation time. We demonstrate how the testbench redundancy can be exploited to gain valuable cycle time during memory BIST simulations.
Keywords :
built-in self test; integrated circuit design; integrated memory circuits; logic design; system-on-chip; built-in self test; design cycle time reduction; design verification time; system-on-chip designs; testbench redundancy; Automatic testing; Built-in self-test; Computational modeling; Instruments; Logic arrays; Logic testing; Random access memory; Redundancy; System-on-a-chip; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, 2006. Held jointly with 5th International Conference on Embedded Systems and Design., 19th International Conference on
ISSN :
1063-9667
Print_ISBN :
0-7695-2502-4
Type :
conf
DOI :
10.1109/VLSID.2006.140
Filename :
1581460
Link To Document :
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