• DocumentCode
    3094762
  • Title

    Impact of trace spacing on noise coupling for guard trace in stripline structure

  • Author

    Guang-Hwa Shiue ; Zhi-Hao Zhang ; Yi-Chin Tsai ; Yu-Han Kao ; Chi-Lou Yeh

  • Author_Institution
    Dept. of Electron. Eng., Chung Yuan Christian Univ., Taoyuan, Taiwan
  • fYear
    2012
  • fDate
    4-7 Dec. 2012
  • Firstpage
    280
  • Lastpage
    282
  • Abstract
    This work investigates how the noise coupling is affected for a guard trace with different trace spacings in stripline structure. For a guard trace maintaining the same trace separation, although reducing crosstalk noise can achieve good efficiency, a guard trace with different trace spacings induces residual crosstalk voltage on the guard trace. Residual crosstalk voltage can be regarded as a main signal and capable of inducing a significant amount of extra crosstalk noise at both the near end and far end on the victim line. To address this issue, 3D full-wave simulation is performed. Compared to the same trace spacing, due to the different trace spacings, the increasing amount of magnitude of time-domain crosstalk noises exceeds 70 % on the victim line. Additionally, in the frequency domain, the increasing amount of magnitude of the first and largest resonant crosstalk peak at about 1GHz is more 25dB.
  • Keywords
    crosstalk; frequency-domain analysis; microstrip lines; time-domain analysis; tracers; 3D full-wave simulation; frequency domain; guard trace; noise coupling; residual crosstalk voltage; resonant crosstalk peak; stripline structure; time-domain crosstalk noises; trace separation; trace spacings; Couplings; Crosstalk; Frequency domain analysis; Noise; Stripline; Time domain analysis; far-end crosstalk noise; guard trace; near-end crosstalk noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference Proceedings (APMC), 2012 Asia-Pacific
  • Conference_Location
    Kaohsiung
  • Print_ISBN
    978-1-4577-1330-9
  • Electronic_ISBN
    978-1-4577-1331-6
  • Type

    conf

  • DOI
    10.1109/APMC.2012.6421572
  • Filename
    6421572