DocumentCode :
3094834
Title :
Kriging Model combined with latin hypercube sampling for surrogate modeling of analog integrated circuit performance
Author :
You, Hailong ; Yang, Maofeng ; Wang, Dan ; Jia, Xinzhang
Author_Institution :
Sch. of Microelectron., Xidian Univ., Xi´´an
fYear :
2009
fDate :
16-18 March 2009
Firstpage :
554
Lastpage :
558
Abstract :
The strong nonlinearity brought by the large circuit scale and more complicated physical/electrical models is making traditional response surface model (i.e. linear or quadratic polynomial) unsuitable for the surrogate-modeling of nowadays integrated circuits. Besides, the random-measurement-error-based analysis techniques and principles developed for traditional response surface model may be meaningless facing the deterministic data from circuit simulation experiments, which are not subject to random measurement errors essentially. Further, traditional response surface model can not mimic circuit behaviors in global process/designable parameter space. This paper proposes using Kriging model combined with Latin hypercube sampling to build surrogate model of circuit performance. We firstly introduce and compare the response surface modeling based on traditional design of experiments and the Kriging modeling combined with Latin hypercube sampling, and then apply both methods to circuit performance surrogate-modeling of an integrated operational amplifier. The result shows that Kriging model needs less sample points and provides 2times higher accuracy than quadratic response surface model does. Kriging modeling of circuit performance can be utilized to estimate parametric yield. Besides, it may facilitate the global optimization of parametric yield or circuit performance.
Keywords :
analogue integrated circuits; integrated circuit modelling; measurement errors; response surface methodology; statistical analysis; Kriging model; Latin hypercube sampling; analog integrated circuit; global optimization; parametric yield; random-measurement-error-based analysis; response surface model; surrogate integrated circuit modeling; Analog integrated circuits; Circuit optimization; Circuit simulation; Hypercubes; Integrated circuit modeling; Integrated circuit yield; Measurement errors; Polynomials; Response surface methodology; Sampling methods; Design of Experiments; Kriging Model; Latin Hypercube Sampling; Response Surface Model; Surrogate-modeling; circuit performance; parametric yield;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality of Electronic Design, 2009. ISQED 2009. Quality Electronic Design
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-2952-3
Electronic_ISBN :
978-1-4244-2953-0
Type :
conf
DOI :
10.1109/ISQED.2009.4810354
Filename :
4810354
Link To Document :
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