A broadband and high tuning sensitivity VCO detector for on-package IR-drop and signal-integrity measurement

Author

Guan-Min Wang ; Yu-Yung Wu ; Sin-Shyh, N.G. ; Lung-Shu Huang ; Sung-Mao Wu

Author_Institution

Dept. of Electr. Eng., Nat. Univ. of Kaohsiung, Kaohsiung, Taiwan

fYear

2012

fDate

4-7 Dec. 2012

Firstpage

292

Lastpage

294

Abstract

Nowadays, ICs work in high speed and high frequency environments, the effects that package brings has become more and more obvious. These effects can be classified as signal integrity (SI) and power integrity (PI). In this paper, A VCO detector circuit with broadband and sensitivity characterizations is designed and used to evaluate on-package DC IR-drop and signal-integrity. The package structure we used in this paper is wire-BGA. The methods for testing IR-drop and SI effects by this wide tuning range and high tuning sensitivity VCO with different package circuit design were shown in this research. Thus, these effects can be observed from the relationship between voltage, frequency, and the trend of the output sweeps.

Keywords

ball grid arrays; integrated circuit testing; sensitivity; voltage-controlled oscillators; IR-drop testing; VCO detector circuit; broadband; high tuning sensitivity VCO detector; on-package DC IR-drop; on-package IR-drop; package circuit design; package structure; power integrity; sensitivity characterizations; signal integrity; signal-integrity measurement; wide tuning range; wire-BGA; Capacitors; Sensitivity; Silicon; Testing; Tuning; Voltage-controlled oscillators; Wires; DC IR-drop; On-package testing; Power Integrity; Signal Integrity; VCO Detector;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Conference Proceedings (APMC), 2012 Asia-Pacific

Conference_Location

Kaohsiung

Print_ISBN

978-1-4577-1330-9

Electronic_ISBN

978-1-4577-1331-6

Type

conf

DOI

10.1109/APMC.2012.6421576

Filename

6421576