DocumentCode :
3094892
Title :
Parallel flow to analyze the impact of the voltage regulator model in nanoscale power distribution network
Author :
Shayan, Amirali ; Hu, Xiang ; Peng, He ; Yu, Wenjian ; Zhang, Wanping ; Chung-kuan Cheng ; Popovich, Mikhail ; Chen, Chung-Kuan ; Chua-Eaon, Lew ; Kong, Xiaohua
Author_Institution :
CSE Dept., Univ. of California, San Diego, CA
fYear :
2009
fDate :
16-18 March 2009
Firstpage :
576
Lastpage :
581
Abstract :
In this paper, an efficient parallel flow for the design of the full power distribution network (PDN) is proposed. The analysis demonstrates the impact of the voltage regulator model in both frequency and time domain response. Based on the experimental results, it is observed that including the voltage regulator model in the PDN model increases the transient voltage drop and PDN response which need to be considered for nanoscale ICs. The flow is optimized using parallel processing to speedup slow response simulation time of the off chip voltage regulator. The study highlights the power integrity issues related to voltage regulator in broadband frequency ranges. The experimental results show speedup of up to 22 times with single processor and more than 430 times using up to 200 processors compared to HSPICE and other commercial simulators. The PDN simulation time is reduced from hours to less than a minute.
Keywords :
VLSI; distribution networks; electric potential; integrated circuit modelling; integrated circuit packaging; power grids; transients; voltage regulators; 2-D partitioned model; VLSI chips; frequency domain response; nanoscale ICs; nanoscale power distribution network; on-chip power grids; parallel flow; parallel processing; time domain response; transient voltage drop; voltage regulator model; voltage regulator module; Circuit noise; Frequency domain analysis; Noise generators; Packaging; Parallel processing; Power systems; Regulators; Time domain analysis; Time factors; Voltage; Power distribution network; frequency-time co-simulation; non-ideal voltage regulator; parallel processing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality of Electronic Design, 2009. ISQED 2009. Quality Electronic Design
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-2952-3
Electronic_ISBN :
978-1-4244-2953-0
Type :
conf
DOI :
10.1109/ISQED.2009.4810358
Filename :
4810358
Link To Document :
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