DocumentCode :
3094896
Title :
Methods of measurement to assess the suitability of materials for the control of static electricity
Author :
Chubb, J.N.
fYear :
1995
fDate :
34786
Firstpage :
42522
Lastpage :
42527
Abstract :
Static electricity presents risks of damage to semiconductor devices in manufacture, circuit board building, handling and servicing. It presents risks to the microelectronic systems through data corruption and operational upset from static discharges. The various ways that the characteristics of materials are relevant to these risks are noted and methods used to assess these characteristics are outlined
fLanguage :
English
Publisher :
iet
Conference_Titel :
ESD (Electrostatic Discharge) and ESD Counter Measures, IEE Colloquium on (Digest No.1995/061)
Conference_Location :
London
Type :
conf
DOI :
10.1049/ic:19950415
Filename :
405145
Link To Document :
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