DocumentCode
3094916
Title
A method for optimizing excitation of electromagnetic ultrasonic Lamb wave
Author
Guofu Zhai ; Tao, Jiang ; Lei Kang ; Shujuan Wang
Author_Institution
Sch. of Electr. Eng. & Autom., Harbin Inst. of Technol., Harbin, China
fYear
2010
fDate
15-17 June 2010
Firstpage
104
Lastpage
108
Abstract
Lamb wave has many applications in non-destructive testing as its advantages of the capability for long-range testing from a single location. Electromagnetic ultrasonic technique also has many advantages, such as being free of couplant and preconditioning. So, electromagnetic ultrasonic Lamb wave possesses great superiority in inspection. However, Lamb wave´s characteristic of multi-modes and dispersion, like other guided waves, is a significant problem for practical applications. In order to obtain clear signals that can be reliably interpreted, a method for optimizing excitation of electromagnetic ultrasonic Lamb wave has been studied. Based on the fundamental characteristic equation of Lamb wave, the exciting equation has been deduced and the exciting curves have been plotted to instruct the design of electromagnetic acoustic transducer (EMAT) for choosing reasonable operating points in the curves. The optimization method verified by experiments can effectively remove the effect of multi-modes and dispersive and the zero-order modes are of great engineering value in real applications.
Keywords
acoustic transducers; electromagnetic waves; excited states; surface acoustic waves; ultrasonic materials testing; ultrasonic waves; dispersion; electromagnetic acoustic transducer; electromagnetic ultrasonic lamb wave; multimodes; nondestructive testing; optimizing excitation; Acoustic transducers; Automatic testing; Coils; Dispersion; Electromagnetic coupling; Electromagnetic scattering; Inspection; Magnetostriction; Nondestructive testing; Optimization methods; EMAT; electromagnetic ultrasonic Lamb wave; exciting equation; operating point;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Electronics and Applications (ICIEA), 2010 the 5th IEEE Conference on
Conference_Location
Taichung
Print_ISBN
978-1-4244-5045-9
Electronic_ISBN
978-1-4244-5046-6
Type
conf
DOI
10.1109/ICIEA.2010.5515193
Filename
5515193
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