Title :
Acceleration factors of PMOS hot carrier degradation
Author_Institution :
Sci. Univ. of Tokyo, Japan
Abstract :
The acceleration factors of hot carrier (HC) degradation are investigated in detail for scaled PMOSFETs. Extrapolated lifetimes under usage conditions are found to be much longer than might be expected from DC stress tests simply interpreted in a traditional manner. The new findings are: (1) the LOG(lifetime) depends on stress-VD not by a factor 1/VD as in NMOSFETs, but by 1/(|VD-V 0), where the constant V0 is a weak function of stress-VG; (2) device parameters have different acceleration factors; ΣIds, which best represents inverter operation, degrades more slowly than VT or Ids (at Vcc/2) under usage condition; (3) the PMOSFET degradation can be slow for another reason: the release of trapped electrons from oxide back to the silicon (Brox et al, IEEE Trans. vol. ED-41, pp. 1184-1196, 1994)
Keywords :
MOSFET; carrier lifetime; electron traps; electron-hole recombination; extrapolation; hot carriers; semiconductor device reliability; semiconductor device testing; DC stress tests; NMOSFETs; PMOS hot carrier degradation acceleration factors; PMOSFET degradation; Si; SiO2-Si; acceleration factors; device parameters; extrapolated lifetimes; hot carrier degradation; inverter operation; scaled PMOSFETs; stress voltage; trapped electron release; Acceleration; Circuits; Degradation; Electron traps; Hot carriers; Inverters; MOS devices; MOSFETs; Stress; Threshold voltage;
Conference_Titel :
Integrated Reliability Workshop Final Report, 1997 IEEE International
Conference_Location :
Lake Tahoe, CA
Print_ISBN :
0-7803-4205-4
DOI :
10.1109/IRWS.1997.660274