DocumentCode :
3095066
Title :
An efficient current-based logic cell model for crosstalk delay analysis
Author :
Das, Debasish ; Scott, William ; Nazarian, Shahin ; Zhou, Hai
Author_Institution :
EECS, Northwestern Univ., Evanston, IL
fYear :
2009
fDate :
16-18 March 2009
Firstpage :
627
Lastpage :
633
Abstract :
Logic cell modeling is an important component in the analysis and design of CMOS integrated circuits, mostly due to nonlinear behavior of CMOS cells with respect to the voltage signal at their input and output pins. A current-based model for CMOS logic cells is presented which can be used for effective crosstalk noise and delta delay analysis in CMOS VLSI circuits. Existing current source models are expensive and need a new set of SPICE-based characterization which is not compatible with typical EDA tools. In this paper we present Imodel, a simple nonlinear logic cell model that can be derived from the typical cell libraries such as NLDM, with accuracy much higher than NLDM-based cell delay models. In fact, our experiments show an average error of 3% compared to SPICE. This level of accuracy comes with a maximum runtime penalty of 19% compared to NLDM-based cell delay models on medium sized industrial designs.
Keywords :
CMOS logic circuits; SPICE; crosstalk; delays; integrated circuit noise; CMOS VLSI circuits; CMOS integrated circuits; NLDM-based cell delay models; SPICE-based characterization; crosstalk delay analysis; current-based logic cell model; CMOS integrated circuits; CMOS logic circuits; Crosstalk; Delay; Integrated circuit modeling; Logic design; Semiconductor device modeling; Signal analysis; Signal design; Voltage; Algorithm design; Convex optimization; Crosstalk analysis; Gate modeling; Simulation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality of Electronic Design, 2009. ISQED 2009. Quality Electronic Design
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-2952-3
Electronic_ISBN :
978-1-4244-2953-0
Type :
conf
DOI :
10.1109/ISQED.2009.4810367
Filename :
4810367
Link To Document :
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