• DocumentCode
    3095434
  • Title

    Functionally valid gate-level peak power estimation for processors

  • Author

    Sambamurthy, Sriram ; Gurumurthy, Sankar ; Vemu, Ramtilak ; Abraham, Jacob A.

  • Author_Institution
    Comput. Eng. Res. Center, Univ. of Texas at Austin, Austin, TX
  • fYear
    2009
  • fDate
    16-18 March 2009
  • Firstpage
    753
  • Lastpage
    758
  • Abstract
    Traditionally, peak power consumption has been estimated at the module-level and there has been no attempt to check the functional validity of the gate-level estimate through instruction execution. This leads to the over design of the processor components that deliver current to the modules. In this work, we present a methodology to estimate the peak dynamic power at the module-level which is functionally valid at the processor-level and thus, avoid the over design. We tackle the problem of module-level peak power estimation by building our algorithm using the reactive tabu search technique. We use a bounded model checker for verifying the instruction validity of the module-level peak power estimates at the processor level. Our algorithm intelligently combines the module-level power estimates with these instruction validity checks and efficiently derives functionally valid peak power estimates. In addition, we automatically derive the sequence of instructions that causes this peak power dissipation for the modules under study. We have evaluated our methodology on modules of the open-risc (OR1200) processor and the results demonstrate that our methodology derives the power estimates efficiently.
  • Keywords
    differentiating circuits; modules; power consumption; search problems; OR1200; bounded model checker; functionally valid gate-level; gate-level estimate; open-risc processor; peak power dissipation; peak power estimation; reactive tabu search; Circuits; Computer aided instruction; Energy consumption; Frequency estimation; Jacobian matrices; Power dissipation; Power engineering and energy; Power engineering computing; Power generation; System testing; Dynamic power; Functionally valid estimation; Instantaneous power; Peak power;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality of Electronic Design, 2009. ISQED 2009. Quality Electronic Design
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-1-4244-2952-3
  • Electronic_ISBN
    978-1-4244-2953-0
  • Type

    conf

  • DOI
    10.1109/ISQED.2009.4810387
  • Filename
    4810387