DocumentCode :
309584
Title :
Diffraction simulation of SAW filters using SAW source distribution
Author :
Hikino, O. ; Koshiba, M. ; Hasegawa, K. ; Shiba, T. ; Yuhara, A. ; Malocha, D.C.
Author_Institution :
Dept. of Electr. & Comput. Eng., Central Florida Univ., Orlando, FL, USA
Volume :
1
fYear :
1996
fDate :
3-6 Nov 1996
Firstpage :
159
Abstract :
A new approach for the simulation of the diffraction effect in Surface Acoustic Wave (SAW) filters based on the two dimensional Angular Spectrum of Wave method is proposed. In this simulation, the line source is considered as the particle displacement distribution inbetween the electrode finger´s overlap region on the surface of the material which was conventionally treated as the uniform intensity line wave source. In this paper, we describe the derivation of the SAW source distribution from the particle displacement which is derived from the three dimensional Finite Element Method (FEM) applied to an IDT finger overlap in the grating structure. Then we apply the above SAW source distribution to the simulation of the frequency response of the SAW filter including the diffraction effect. The frequency dependency of the SAW source distribution is also discussed. The diffraction simulation including the newly presented method along with the conventional method are compared with the experimental results
Keywords :
electrodes; finite element analysis; frequency response; simulation; surface acoustic wave filters; ultrasonic diffraction; SAW filters; SAW source distribution; diffraction simulation; electrode finger overlap region; frequency response; grating structure; line source; particle displacement distribution; three dimensional finite element method; two dimensional angular spectrum of wave method; Acoustic diffraction; Acoustic waves; Electrodes; Fingers; Finite element methods; Frequency response; Gratings; SAW filters; Surface acoustic waves; Surface treatment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics Symposium, 1996. Proceedings., 1996 IEEE
Conference_Location :
San Antonio, TX
ISSN :
1051-0117
Print_ISBN :
0-7803-3615-1
Type :
conf
DOI :
10.1109/ULTSYM.1996.583830
Filename :
583830
Link To Document :
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