DocumentCode :
3096012
Title :
Acoustic characteristics of the third-order quasi-symmetric Lamb wave mode in an AlN/3C-SiC plate
Author :
Chih-Ming Lin ; Yung-Yu Chen ; Felmetsger, V. ; Senesky, Debbie G. ; Pisano, Albert P.
Author_Institution :
Dept. of Mech. Eng., Univ. of California, Berkeley, Berkeley, CA, USA
fYear :
2013
fDate :
21-25 July 2013
Firstpage :
1093
Lastpage :
1096
Abstract :
In this study, the phase velocity and electromechanical coupling coefficient of the third-order quasi-symmetric (QS3) Lamb wave mode in a composite membrane composed of an AlN film and a cubic silicon carbide (3C-SiC) layer are theoretically and experimentally investigated. According to the theoretical simulation results, the epitaxial 3C-SiC (100) layer enhances the electromechanical coupling coefficient of the QS3 Lamb wave mode in the composite plate with a proper thickness ratio of AlN film to 3C-SiC layer. In addition, the 3C-SiC layer smoothes the phase velocity dispersion, making the QS3 mode applicable to the designs for the Lamb wave resonators. The experimental results show that the epitaxial 3C-SiC layer not only boosts the quality factor (Q) but also reduces the temperature coefficient of frequency (TCF) of the QS3 Lamb wave mode. While the 2.5-μm-thick AlN film and 2.6-μm-thick epitaxial 3C-SiC layer are employed, a Lamb wave resonator utilizing the QS3 mode exhibits a low motional impedance of 91 ohm and a high Q up to 5510 at a series resonance frequency (fs) of 2.92 GHz, resulting in a very high fs·Q product, 1.61×1013 Hz.
Keywords :
III-V semiconductors; Q-factor; acoustic impedance; acoustic wave velocity; aluminium compounds; composite materials; electromechanical effects; membranes; plates (structures); semiconductor thin films; silicon compounds; structural acoustics; surface acoustic waves; wide band gap semiconductors; AlN-SiC; Lamb wave resonators; acoustic properties; composite membrane; cubic silicon carbide epitaxial layer; electromechanical coupling coefficient; film; frequency 2.92 GHz; motional impedance; phase velocity dispersion; plate; size 2.5 mum; size 2.6 mum; temperature coefficient of frequency; third-order quasisymmetric Lamb wave mode; Couplings; Electrodes; Epitaxial growth; III-V semiconductor materials; Resonant frequency; Silicon carbide; Lamb wave resonator; QS3 Lamb wave model; RF MEMS; aluminum nitride; cubic silicon carbide; high quality factor; third-order quasi-symmetric mode;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics Symposium (IUS), 2013 IEEE International
Conference_Location :
Prague
ISSN :
1948-5719
Print_ISBN :
978-1-4673-5684-8
Type :
conf
DOI :
10.1109/ULTSYM.2013.0280
Filename :
6725011
Link To Document :
بازگشت