DocumentCode :
309607
Title :
Radial dependence of mass sensitivity for modified-electrode quartz crystal resonators
Author :
Lee, Youbok ; Josse, Fabien
Author_Institution :
Microsensor Res. Lab., Marquette Univ., Milwaukee, WI, USA
Volume :
1
fYear :
1996
fDate :
3-6 Nov 1996
Firstpage :
321
Abstract :
Quartz crystal resonators (QCR) with “modified electrode” geometries have been investigated as detectors in liquids and shown to have high sensitivity to the electrical properties of the load, caused by changes in the electrostatic capacitance. However, the ability of the crystal plate to have a stable vibration under the load is often impaired, due to the electrode geometry. In the present work, the mass sensitivity profile at the sensing surface is analytically calculated for various modified-electrode QCRs. The sensing surface is divided into a fully electroded, a partially electroded and an unelectroded region. The efficiency of each region is evaluated to determine possible design trade-offs for stable modified electrode QCRs. It is shown that, for some values of the electrode mass loading factor, the efficiency of the partially electroded region can be significant and thus must be accounted for as part of a stable sensing surface. Experimental measurements of the differential mass sensitivity were performed for a modified-electrode QCR and compared to theory
Keywords :
capacitance; crystal resonators; electric sensing devices; electrodes; level measurement; quartz; SiO2; design trade-offs; electrode geometry; electrostatic capacitance; fully electroded region; liquid environment detection device; load electrical properties; mass sensitivity; modified-electrode quartz crystal resonators; partially electroded region; sensing surface; stable vibration; unelectroded region; Capacitance measurement; Electric variables measurement; Electrodes; Electrostatic measurements; Geometry; Laboratories; Mechanical factors; Resonance; Stability; Vibrations;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics Symposium, 1996. Proceedings., 1996 IEEE
Conference_Location :
San Antonio, TX
ISSN :
1051-0117
Print_ISBN :
0-7803-3615-1
Type :
conf
DOI :
10.1109/ULTSYM.1996.583983
Filename :
583983
Link To Document :
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