DocumentCode
3096167
Title
ScAlN Lamb wave resonator in GHz range released by XeF2 etching
Author
Konno, Akitoyo ; Sumisaka, M. ; Teshigahara, Akihiko ; Kano, Kazuhiko ; Hashimo, Ken-ya ; Hirano, Harutoyo ; Esashi, Masayoshi ; Kadota, Mitsuhiro ; Tanaka, Shoji
Author_Institution
Grad. Sch. of Eng., Tohoku Univ., Sendai, Japan
fYear
2013
fDate
21-25 July 2013
Firstpage
1378
Lastpage
1381
Abstract
Recently, it was reported that the piezoelectric characteristic of AlN was enhanced by doping Sc, and that 40% Sc-doped AlN (Sc0.4Al0.6N) had approximately 5 times higher piezoelectricity than pure AlN. In this study, we designed, fabricated and evaluated Lamb wave resonators using a Sc0.4Al0.6N thin film. First, we examined elastic constants c44E and c44D of Sc0.4Al0.6N using a thickness-shear wave resonator excited by parallel electric field, and then designed Lamb wave resonators using revised material constants. The Lamb wave resonators were fabricated by electron beam lithography, reactive ion etching, XeF2 release etching etc. The maximum and average electromechanical coupling coefficients were 8.3% and 6.8%, respectively, for 2.6 GHz devices working in S0 mode.
Keywords
III-V semiconductors; aluminium compounds; elastic constants; electron beam lithography; piezoelectric thin films; piezoelectricity; scandium compounds; semiconductor doping; semiconductor thin films; sputter etching; surface acoustic wave resonators; wide band gap semiconductors; Lamb wave resonators; Sc doping; Sc0.4Al0.6N; elastic constants; electromechanical coupling coefficients; electron beam lithography; parallel electric fields; piezoelectricity; reactive ion etching; revised material constants; shear wave resonator; thin films; Couplings; Etching; Films; Frequency measurement; III-V semiconductor materials; Resonant frequency; Lamb wave; Micro Electro Mechanical Systems (MEMS); Resonator; ScAlN;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrasonics Symposium (IUS), 2013 IEEE International
Conference_Location
Prague
ISSN
1948-5719
Print_ISBN
978-1-4673-5684-8
Type
conf
DOI
10.1109/ULTSYM.2013.0350
Filename
6725020
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