• DocumentCode
    3096291
  • Title

    Analysis of Rayleigh wave radiations from leaky SAW resonators

  • Author

    Inoue, Shingo ; Nakamura, Kentaro ; Nakazawa, H. ; Tsutsumi, J. ; Ueda, Makoto ; Satoh, Y.

  • Author_Institution
    Microdevice R&D Dept., Taiyo Yuden Co., Ltd., Akashi, Japan
  • fYear
    2013
  • fDate
    21-25 July 2013
  • Firstpage
    1953
  • Lastpage
    1956
  • Abstract
    The Rayleigh wave radiations from leaky surface acoustic wave (SAW) resonators on around 42° Y-cut LiTaO3 substrates are known as one of acoustic loss mechanisms. This paper analyzes and characterizes the Rayleigh wave radiations and develops the analytical model for the radiations. First, the finite element method (FEM) analyses and optical probe measurements reveal that the scattering of leaky SAW at the gap between interdigital transducer (IDT) and dummy electrodes generates the Rayleigh wave radiations. Based on the result, the simple and fast analytical model using the point sources is developed to simulate the Rayleigh wave radiations. The model precisely simulates the measurement patterns of radiations about 1,000 times faster than the FEM.
  • Keywords
    Rayleigh scattering; Rayleigh waves; finite element analysis; interdigital transducers; lithium compounds; surface acoustic wave resonators; tantalum compounds; FEM analysis; IDT; LiTaO3; Rayleigh wave radiation analysis; acoustic loss mechanisms; dummy electrodes; finite element method; interdigital transducer; leaky SAW resonators; leaky SAW scattering; leaky surface acoustic wave resonators; optical probe measurements; point sources; radiation measurement pattern; Analytical models; Finite element analysis; Frequency measurement; Lithium compounds; Optical resonators; Resonant frequency; Surface acoustic waves; Rayleigh wave; leaky SAW; radiation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium (IUS), 2013 IEEE International
  • Conference_Location
    Prague
  • ISSN
    1948-5719
  • Print_ISBN
    978-1-4673-5684-8
  • Type

    conf

  • DOI
    10.1109/ULTSYM.2013.0498
  • Filename
    6725027