DocumentCode :
3096339
Title :
V(x,t) acoustic microscopy method for leaky surface acoustic waves parameters measurements
Author :
Titov, S.A. ; Maev, R.G.
Author_Institution :
Sch. of Phys. Sci., Windsor Univ., Ont., Canada
Volume :
1
fYear :
2000
fDate :
36800
Firstpage :
607
Abstract :
In this paper, a new method for the measurement of the acoustical parameters of the laterally uniform specimen is considered. Two focused large angular aperture transducers are used in this technique. Foci of the transducers are placed on the specimen surface and received voltage V(x,t) is acquired during the relative transducers translation along the specimen surface. Due to geometry of the ultrasonic system, angular range of the generated and detected waves can be close to (0, π/2) and the length of the recording distance is unlimited. Velocity and attenuation of the leaky wave measured by this method do not depend on the temperature of the immersion liquid. Also, contrary to V(z) method, angular resolution of the V(x,t) method is better for small incident angles
Keywords :
acoustic microscopy; surface acoustic waves; ultrasonic measurement; V(x,t) method; acoustic microscopy; acoustic parameters measurement; angular resolution; focused ultrasonic transducer; immersion liquid; leaky surface acoustic wave; Acoustic measurements; Acoustic transducers; Acoustic waves; Apertures; Attenuation; Geometry; Microscopy; Surface acoustic waves; Ultrasonic transducers; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics Symposium, 2000 IEEE
Conference_Location :
San Juan
ISSN :
1051-0117
Print_ISBN :
0-7803-6365-5
Type :
conf
DOI :
10.1109/ULTSYM.2000.922622
Filename :
922622
Link To Document :
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