DocumentCode
3096906
Title
State-of-art, challenges and future directions in large signal measurements for active device modeling
Author
Schreurs, Dominique
Author_Institution
Div. ESAT-TELEMIC, K.U. Leuven, Leuven, Belgium
fYear
2010
fDate
23-28 May 2010
Firstpage
1210
Lastpage
1213
Abstract
Vector non-linear measurements emerged two decades ago, initiating a vast range of novel applications in microwave characterisation, modeling, and design. This paper focuses on its impact on microwave active device modeling. After sketching the evolution in instrumentation, the present capabilities are described. Today´s developments are happening swiftly and on a large scale. As communication becomes more low-power, more wireless, and more bandwidth demanding, requirements for device models have evolved as well. In this paper, the present challenges in modeling and thus directions in instrumentation development are discussed.
Keywords
microwave devices; microwave measurement; instrumentation development; large signal measurements; microwave active device modeling; Frequency measurement; Instruments; Microwave devices; Microwave measurements; Oscilloscopes; Power measurement; Pulse measurements; Sampling methods; Time measurement; Voltage; Active devices; behavioral modeling; non-linear circuits; non-linear measurements; non-linear modeling;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest (MTT), 2010 IEEE MTT-S International
Conference_Location
Anaheim, CA
ISSN
0149-645X
Print_ISBN
978-1-4244-6056-4
Electronic_ISBN
0149-645X
Type
conf
DOI
10.1109/MWSYM.2010.5515304
Filename
5515304
Link To Document