• DocumentCode
    3096906
  • Title

    State-of-art, challenges and future directions in large signal measurements for active device modeling

  • Author

    Schreurs, Dominique

  • Author_Institution
    Div. ESAT-TELEMIC, K.U. Leuven, Leuven, Belgium
  • fYear
    2010
  • fDate
    23-28 May 2010
  • Firstpage
    1210
  • Lastpage
    1213
  • Abstract
    Vector non-linear measurements emerged two decades ago, initiating a vast range of novel applications in microwave characterisation, modeling, and design. This paper focuses on its impact on microwave active device modeling. After sketching the evolution in instrumentation, the present capabilities are described. Today´s developments are happening swiftly and on a large scale. As communication becomes more low-power, more wireless, and more bandwidth demanding, requirements for device models have evolved as well. In this paper, the present challenges in modeling and thus directions in instrumentation development are discussed.
  • Keywords
    microwave devices; microwave measurement; instrumentation development; large signal measurements; microwave active device modeling; Frequency measurement; Instruments; Microwave devices; Microwave measurements; Oscilloscopes; Power measurement; Pulse measurements; Sampling methods; Time measurement; Voltage; Active devices; behavioral modeling; non-linear circuits; non-linear measurements; non-linear modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest (MTT), 2010 IEEE MTT-S International
  • Conference_Location
    Anaheim, CA
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4244-6056-4
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2010.5515304
  • Filename
    5515304