DocumentCode
3097204
Title
Load Shedding Scheme Ensuring Voltage Stability
Author
Fu, Xu ; Wang, Xifan
Author_Institution
Dept. of Electr. Eng., Univ. of Xi´´an JiaoTong, Xi´´an
fYear
2007
fDate
24-28 June 2007
Firstpage
1
Lastpage
6
Abstract
A computationally simple algorithm is developed for studying the load shedding problem in emergencies where an ac power flow solution cannot be found for the stressed system. The proposed algorithm is divided into two sub-problems: restoring solvability sub-problem and improving voltage stability margin (VSM) sub-problem. Linear optimization (LP)-based optimal power flow (OPF) is applied to solve each sub-problem. In restoring solvability sub-problem, rather than taking restoring power flow solvability as direct objective function, the objective function of maximization of voltage magnitudes of weak buses is employed. In VSM sub-problem, the traditional load-shedding objective is extended to incorporate both technical and economic effects of load shedding and the linearized VSM constraint was added into the LP-based OPF. Case studies with a real 682 bus system are presented. The simulation results show that the proposed load shedding algorithm is effective, fast in finding the load shedding scheme to solve the problem of restoring solvability and improving VSM.
Keywords
linear programming; load flow; load shedding; power system stability; AC power flow; direct objective function; linear optimization-based optimal power flow; linear programming; load shedding scheme; sub-problems restoring solvability sub-problem; voltage magnitudes; voltage stability; voltage stability margin sub-problem; Linear programming; Load flow; Power generation economics; Power system economics; Power system interconnection; Power system restoration; Power system security; Power system stability; Power transmission lines; Voltage; linear programming (LP); load shedding; power flow solvability; voltage stability margin (VSM);
fLanguage
English
Publisher
ieee
Conference_Titel
Power Engineering Society General Meeting, 2007. IEEE
Conference_Location
Tampa, FL
ISSN
1932-5517
Print_ISBN
1-4244-1296-X
Electronic_ISBN
1932-5517
Type
conf
DOI
10.1109/PES.2007.385850
Filename
4275616
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