Title :
Modified Butterworth-Van Dyke circuit for FBAR resonators and automated measurement system
Author :
Larson, John D., III ; Bradley, Paul D. ; Wartenberg, Scott ; Ruby, Richard C.
Author_Institution :
Electron. Res. Labs., Agilent Labs., Palo Alto, CA, USA
Abstract :
Microwave Film Bulk Acoustic Resonators (FBARs) may be characterized by means of the Mason transmission line model, but for parameter extraction and design studies, the lumped Butterworth-Van Dyke (BVD) model is more useful. We propose a modification to the standard five element BVD model, in which a second resistor is added in series with the plate capacitance C0. This improves the model predictions as compared to the data obtained from a network analyzer (NWA). Here, the modified model will be developed in terms of the resonant frequencies, effective coupling constant kt2 , and the quality factor Q, as determined from the S parameters of an FBAR measured by the NWA. To evaluate the FBAR resonators on a routine basis, an automated data acquisition and parameter extraction method based on the Modified Butterworth-Van Dyke model (MBVD) is described. An Agilent Technologies 8753ES NWA operating under Personal Computer control is used to acquire and process FBAR data by means of a custom HPVEETM program, which transfers data from the NWA, and extracts the six MBVD circuit parameters. Excellent agreement is obtained between the measured data for a typical FBAR resonator and calculated “postdictions” obtained from the MBVD circuit. Coupled with the automated method, which takes about 10 seconds per resonator to perform a complete extraction cycle, a computer controlled probing station is used to acquire data from several hundred resonators on the wafer upon which the FBARS were fabricated. With this speed and probing capability, it is feasible to wafer map the FBARs for uniformity. Contour plots of the measured resonant frequency and coupling constant kt2 will be presented to illustrate the capability
Keywords :
Q-factor; S-parameters; acoustic microwave devices; acoustic resonators; automatic testing; bulk acoustic wave devices; computerised instrumentation; data acquisition; 10 s; Agilent Technologies 8753ES NWA; FBAR resonators; HPVEE program; MBVD circuit parameter; Mason transmission line model; S parameters; automated data acquisition; automated measurement system; computer controlled probing station; contour plots; coupling constant; effective coupling constant; extraction cycle; five element BVD model; lumped Butterworth-Van Dyke model; microwave film bulk acoustic resonators; modified Butterworth-Van Dyke circuit; parameter extraction; parameter extraction method; personal computer control; plate capacitance; quality factor; resonant frequencies; resonant frequency; Automatic control; Capacitance; Data mining; Distributed parameter circuits; Film bulk acoustic resonators; Frequency measurement; Levee; Parameter extraction; Resistors; Resonant frequency;
Conference_Titel :
Ultrasonics Symposium, 2000 IEEE
Conference_Location :
San Juan
Print_ISBN :
0-7803-6365-5
DOI :
10.1109/ULTSYM.2000.922679