Title :
A current conveyor based BIC sensor for current monitoring in mixed-signal circuits
Author :
Siskos, S. ; Laopoulos, Th ; Hatzopoulos, A.A. ; Bafleur, M.
Author_Institution :
Aristotelian Univ. of Thessaloniki, Greece
Abstract :
Quiescent current monitoring is considered as an interesting and efficient technique for mixed-signal testing, where fault detection of analog parts requires the precise measure of the Iddq. This paper presents a very simple current sensor for on-chip current monitoring giving an accurate analog output proportional to the quiescent current. The proposed circuit is based on a second generation current conveyor. Experimental results show the functionality of the proposed configuration and its linear output characteristic
Keywords :
current conveyors; electric current measurement; electric sensing devices; integrated circuit testing; mixed analogue-digital integrated circuits; IDDQ measurement; built-in current sensor; fault detection; mixed-signal circuit testing; on-chip quiescent current monitoring; second generation current conveyor; CMOS technology; Circuit faults; Circuit testing; Computerized monitoring; Condition monitoring; Current supplies; Electrical fault detection; Electronic equipment testing; Fault detection; Voltage;
Conference_Titel :
Electronics, Circuits, and Systems, 1996. ICECS '96., Proceedings of the Third IEEE International Conference on
Conference_Location :
Rodos
Print_ISBN :
0-7803-3650-X
DOI :
10.1109/ICECS.1996.584646
