DocumentCode :
3097517
Title :
Growth and characterization of nanowires and nanorods on Al2O3(110), Si(111) and SiO2/p-Si(100) by MOCVD
Author :
Rivera, Abdiel ; Anwar, Mehdi ; Monville, Mathiey R. ; Chang, Shihsheng ; Zeller, John ; Sood, Ashok K. ; Manzur, Tariq
Author_Institution :
Dept. of Electr. Eng., Univ. of Connecticut, Storrs, CT, USA
fYear :
2011
fDate :
7-9 Dec. 2011
Firstpage :
1
Lastpage :
2
Abstract :
We report growth of ZnO nanowires and nanorods using an atmospheric pressure, horizontal MOCVD, without any metal catalyst. The ZnO structures were grown on sapphire (110), Si(111) and SiO2/p-Si(111) substrates by controlling the ZnO precursor flow, growth temperature and distance from the injector. Prior to the growth of the nanostructure, a thin film of ZnO was grown at 400°C for 2 mins, DeZ was used as ZnO precursor with a flow rate of 200 sccm, N2O was used as oxygen source with a flow rate of 50 sccm and N2 was used as the carrier gas.
Keywords :
II-VI semiconductors; MOCVD; nanofabrication; nanorods; nanowires; semiconductor growth; semiconductor thin films; wide band gap semiconductors; zinc compounds; Al2O3; Al2O3(110) substrates; MOCVD; Si; Si(111) substrates; SiO2-Si; SiO2-p-Si(111) substrates; ZnO; atmospheric pressure; carrier gas; growth distance; growth temperature; nanorods; nanowires; pressure 1 atm; sapphire (110) substrates; temperature 400 degC; thin film; time 2 min; Educational institutions; Electrical engineering; MOCVD; Nanowires; USA Councils; Zinc oxide;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Device Research Symposium (ISDRS), 2011 International
Conference_Location :
College Park, MD
Print_ISBN :
978-1-4577-1755-0
Type :
conf
DOI :
10.1109/ISDRS.2011.6135147
Filename :
6135147
Link To Document :
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