DocumentCode :
3097730
Title :
Temperature dependent linear HEMT model extracted with multi-temperature optimization
Author :
Yu Zhu ; Karalkar, Sagar ; Prasad, K. ; Cejun Wei ; Mason, Jennifer ; Bartle, Dylan
Author_Institution :
Skyworks Solutions Inc., Woburn, MA, USA
fYear :
2012
fDate :
4-7 Dec. 2012
Firstpage :
756
Lastpage :
758
Abstract :
Temperature dependent model is conventionally developed with 1) individual linear model extraction at each temperature and 2) temperature dependence extraction for each model parameter. A novel approach based on a multi-temperature optimization is proposed in this study. The new approach is faster and more accurate since the linear models at different temperatures are extracted simultaneously and inter-relatedly. It has been found, based on the model extracted, that there is a specific gate-source voltage of Vgs0, where the transconductance (Gm) keeps constant versus temperature. Gm increases (decreases) with temperature for Vgs<;Vgs0 (Vgs>;Vgs0). With increasing temperature, a substantial decrease in extrinsic inductance is also observed. Our findings are believed to be useful for designing HEMT amplifiers with less temperature dependence.
Keywords :
amplifiers; circuit simulation; high electron mobility transistors; inductance; optimisation; semiconductor device models; HEMT amplifiers; extrinsic inductance; gate-source voltage; multitemperature optimization; specific gate-source voltage; temperature dependent linear HEMT model extraction; transconductance; Fitting; HEMTs; Integrated circuit modeling; Optimization; Scattering parameters; Temperature dependence; Temperature measurement; Amplifiers; HEMTs; circuit simulation; parameter extraction; semiconductor device model; temperature dependence;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference Proceedings (APMC), 2012 Asia-Pacific
Conference_Location :
Kaohsiung
Print_ISBN :
978-1-4577-1330-9
Electronic_ISBN :
978-1-4577-1331-6
Type :
conf
DOI :
10.1109/APMC.2012.6421725
Filename :
6421725
Link To Document :
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