An analysis of the in-plane acceleration sensitivity of contoured quartz resonators rigidly supported along the edges

Author

Shick, D.V. ; Tiersten, H.F.

Author_Institution

Dept. of Mech. Eng., Aeronaut. Eng. & Mech., Rensselaer Polytech. Inst., Troy, NY, USA

fYear

1989

fDate

31 May-2 Jun 1989

Firstpage

405

Lastpage

412

Abstract

The in-plane acceleration sensitivity of contoured AT- and SC-cut quartz crystal resonators with the same support configuration is performed. The extensional biasing deformation field is determined by means of the variational approximation procedure using the variational principle in which all conditions appear as natural conditions. The resulting extensional biasing state is used in the existing perturbation equation along with the mode shapes of the contoured resonators to calculate the in-plane acceleration sensitivities. Results are presented as a function of the planar aspect ratio and orientation of the rectangle

Keywords

crystal resonators; quartz; variational techniques; AT-cut; SC-cut; contoured quartz resonators; extensional biasing deformation field; in-plane acceleration sensitivity; mode shapes; orientation; perturbation equation; planar aspect ratio; support configuration; variational approximation procedure; variational principle; Acceleration; Aerospace engineering; Anisotropic magnetoresistance; Information analysis; Mechanical engineering; Nonlinear equations; Performance analysis; Shape; Stress;

fLanguage

English

Publisher

ieee

Conference_Titel

Frequency Control, 1989., Proceedings of the 43rd Annual Symposium on

Conference_Location

Denver, CO

Type

conf

DOI

10.1109/FREQ.1989.68896

Filename

68896