DocumentCode :
3097813
Title :
Investigation of microwave breakdown in the relativistic Cherenkov-type devices
Author :
Ilyakov, E.V. ; Kulagin, I.S. ; Zaitsev, N.I.
Author_Institution :
Inst. of Appl. Phys., Acad. of Sci., Nizhny Novgorod, Russia
fYear :
1999
fDate :
36373
Firstpage :
210
Lastpage :
213
Abstract :
Microwave breakdown is one of the main reasons which limit the power and the pulse duration of output radiation in microwave devices driven by high-current relativistic electron beams (REBs). At an RF field of more than 300 kV/cm, the microwave pulse duration is determined by the time of development of explosive emission (EE). At smaller field, the microwave breakdown is initiated by RF discharges or bombardment of a slow-wave structure (SWS) by charged particles. The present work is devoted to the peculiarities of such initiation. An X-band, E01 -mode relativistic carcinotron operating with moderate power of output radiation was used as the tested device. The rated REB diameter in the SWS was 15 mm. The REB formed both in the coaxial diode conventional for relativistic electronics (edge cathode of 32 mm in diameter) and in the magnetron-injection gun with thermionic cathode (the emitter diameter 100 mm)
Keywords :
Cherenkov radiation; carcinotrons; electric breakdown; high-frequency discharges; microwave tubes; relativistic electron beam tubes; slow wave structures; space charge; RF discharges; RF field; X-band; charged particles; coaxial diode; explosive emission; high-current relativistic electron beams; magnetron-injection gun; microwave breakdown; microwave pulse duration; microwave tubes; relativistic Cherenkov-type devices; relativistic carcinotron; slow-wave structure; Acceleration; Cathodes; Coils; Electric breakdown; Electrons; Microwave devices; Plasma accelerators; Power generation; Radio frequency; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics and Radiophysics of Ultra-High Frequencies, 1999. International University Conference Proceedings
Conference_Location :
St Petersburg
Print_ISBN :
5-7422-0083-8
Type :
conf
DOI :
10.1109/UHF.1999.787918
Filename :
787918
Link To Document :
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