• DocumentCode
    3097866
  • Title

    A Technique for Optimal Shunt Capacitor Reallocation Considering Voltage Stability in N-1 Contingencies

  • Author

    Ohtake, Hiroshi ; Kimura, Katsuyuki ; Iwamoto, Shinichi

  • Author_Institution
    Dept. of Electr. Eng. & Biosci., Waseda Univ., Tokyo
  • fYear
    2007
  • fDate
    24-28 June 2007
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    As certain electric power facilities have been used for a long time, some of these facilities have to be replaced due to age. Meanwhile, as the deregulation of the electric power industry has been prevailing, cost reduction and effective use of existing facilities are required in addition to ensuring stability. In this paper, we propose a new technique for optimal shunt capacitor (SC) reallocation. A feature of the technique is that not only the steady state but also all the N-l contingencies are considered as constraints of an objective function. In the formulated objective function, the voltage stability index VMPI is included to consider the upper and lower limits of voltage. Moreover, the issue of finding an optimal solution for the objective function is a combinatorial optimization problem. Therefore, we solve the problem by using genetic algorithm, which is one of the methodologies involved in meta-heuristics. Simulations are carried out by using a 22 bus system to verify the proposed method.
  • Keywords
    genetic algorithms; power capacitors; power system stability; N-1 contingencies; combinatorial optimization problem; electric power facilities; electric power industry; genetic algorithm; meta-heuristics; objective function; optimal shunt capacitor reallocation; voltage stability index; Acceleration; Capacitors; Cost function; Dynamic programming; Genetic algorithms; Power supplies; Reactive power; Stability; Steady-state; Voltage; Combinatorial Optimization Problem; Genetic Algorithm; Optimal Allocation; Voltage Stability; Voltage Stability Index VMPI;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Engineering Society General Meeting, 2007. IEEE
  • Conference_Location
    Tampa, FL
  • ISSN
    1932-5517
  • Print_ISBN
    1-4244-1296-X
  • Electronic_ISBN
    1932-5517
  • Type

    conf

  • DOI
    10.1109/PES.2007.385887
  • Filename
    4275653