DocumentCode :
3097866
Title :
A Technique for Optimal Shunt Capacitor Reallocation Considering Voltage Stability in N-1 Contingencies
Author :
Ohtake, Hiroshi ; Kimura, Katsuyuki ; Iwamoto, Shinichi
Author_Institution :
Dept. of Electr. Eng. & Biosci., Waseda Univ., Tokyo
fYear :
2007
fDate :
24-28 June 2007
Firstpage :
1
Lastpage :
6
Abstract :
As certain electric power facilities have been used for a long time, some of these facilities have to be replaced due to age. Meanwhile, as the deregulation of the electric power industry has been prevailing, cost reduction and effective use of existing facilities are required in addition to ensuring stability. In this paper, we propose a new technique for optimal shunt capacitor (SC) reallocation. A feature of the technique is that not only the steady state but also all the N-l contingencies are considered as constraints of an objective function. In the formulated objective function, the voltage stability index VMPI is included to consider the upper and lower limits of voltage. Moreover, the issue of finding an optimal solution for the objective function is a combinatorial optimization problem. Therefore, we solve the problem by using genetic algorithm, which is one of the methodologies involved in meta-heuristics. Simulations are carried out by using a 22 bus system to verify the proposed method.
Keywords :
genetic algorithms; power capacitors; power system stability; N-1 contingencies; combinatorial optimization problem; electric power facilities; electric power industry; genetic algorithm; meta-heuristics; objective function; optimal shunt capacitor reallocation; voltage stability index; Acceleration; Capacitors; Cost function; Dynamic programming; Genetic algorithms; Power supplies; Reactive power; Stability; Steady-state; Voltage; Combinatorial Optimization Problem; Genetic Algorithm; Optimal Allocation; Voltage Stability; Voltage Stability Index VMPI;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Engineering Society General Meeting, 2007. IEEE
Conference_Location :
Tampa, FL
ISSN :
1932-5517
Print_ISBN :
1-4244-1296-X
Electronic_ISBN :
1932-5517
Type :
conf
DOI :
10.1109/PES.2007.385887
Filename :
4275653
Link To Document :
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