Title :
A diagnostic setup for measurement of time-resolved electron beam distributions in high-power O-type devices
Author :
Arkhipov, A.V. ; Dvoretskaja, N.V. ; Sominski, G.G.
Author_Institution :
St. Petersburg State Tech. Univ., Russia
Abstract :
Characteristics of a new all-in-one setup for experimental determination of electron beam parameters of high-power microwave O-type devices are given. The measurements were made in the collector part of the device, where the electron beam expanded in the absence of external electric or magnetic fields after interaction with the rf structure. The analyzing section was mounted to the microwave tube instead of the collector unit to measure spatial, angular and energy distributions of the electron beam
Keywords :
electron beams; electron tube testing; microwave tubes; particle beam diagnostics; angular distribution; collector part; diagnostic setup; electron beam parameters; energy distribution; high-power microwave O-type devices; microwave tube; spatial distribution; time-resolved electron beam distribution measurement; Current density; Electrodes; Electromagnetic heating; Electron beams; Gyrotrons; Magnetic analysis; Magnetic field measurement; Microwave devices; Plasma devices; Probes;
Conference_Titel :
Electronics and Radiophysics of Ultra-High Frequencies, 1999. International University Conference Proceedings
Conference_Location :
St Petersburg
Print_ISBN :
5-7422-0083-8
DOI :
10.1109/UHF.1999.787925
