Title :
Pulsed laser deposition of hafnium oxide on quartz substrate
Author :
Plociennik, Przemyslaw ; Zawadzka, Anna ; Lukasiak, Zbigniew ; Brodzinska, Karolina ; Korcala, Andrzej ; Bartkiewicz, Krzysztof
Author_Institution :
Inst. of Phys., Nicolaus Copernicus Univ., Torun, Poland
Abstract :
In this paper, we report the experimental investigation of optical properties of HfO2 (hafnium oxide) thin films grown on quartz substrates by pulsed laser deposition (PLD) method [1]. Cold pressed powders of hafnium oxide (HfO2 98% - Aldrich Chem. Co.) were used as the target for deposition process. The transparent quartz substrate was heated up to temperature in the range between 200 and 600 °C. Optical properties of the films were investigated by transmittance in the ultra-violet, visible and near infrared range and photoluminescence spectroscopy. We measure the photo-luminescence spectra and dynamics of luminescence process [2]. The PL spectra contained one strong maximum at 385 nm and the peak intensity decreases rapidly with increasing temperature. Optical properties are closely related to the structure of the hafnium oxide thin films.
Keywords :
hafnium compounds; infrared spectra; photoluminescence; pulsed laser deposition; thin films; ultraviolet spectra; visible spectra; HfO2; SiO2; cold pressed powder; luminescence process dynamics; near infrared spectroscopy; optical property; photoluminescence spectra measurement; photoluminescence spectroscopy; pulsed laser deposition; temperature 200 degC to 600 degC; thin film; transmittance; transparent quartz substrate; ultraviolet spectroscopy; visible spectroscopy; wavelength 385 nm; Hafnium oxide; Integrated optics; Optical films; Photoluminescence; Substrates; Temperature measurement; PLD (Pulsed Laser Deposition); hafnium oxide; photoluminescence; transmission;
Conference_Titel :
Transparent Optical Networks (ICTON), 2013 15th International Conference on
Conference_Location :
Cartagena
DOI :
10.1109/ICTON.2013.6602905