Title : 
Simulation comparison of reset operation for mushroom phase change memory cells with different access device
         
        
            Author : 
Faraclas, Azer ; Williams, Nicholas ; Gokirmak, Ali ; Silva, Helena
         
        
            Author_Institution : 
Electr. & Comput. Eng., Univ. of Connecticut, Storrs, CT, USA
         
        
        
        
        
        
            Abstract : 
Phase change memory (PCM) is considered to be a promising candidate for high density, fast and non-volatile memory technologies. PCM devices are resistive memory elements where the crystalline (set) and amorphous (reset) states typically have ~102-104 times difference in resistance values. The transitions between these states are achieved through localized self-heating with large current densities. Scaling device dimensions improves packing density and speed and results in reduced peak current, power and total energy required for switching [1].
         
        
            Keywords : 
current density; phase change memories; PCM devices; access device; amorphous state; crystalline state; current density; high-density memory technology; localized self-heating; mushroom phase change memory cells; nonvolatile memory technology; packing density; reset operation; resistive memory elements; scaling device dimensions; Conductivity; FETs; Heating; Phase change materials; Resistors; Thermal conductivity; Tin;
         
        
        
        
            Conference_Titel : 
Semiconductor Device Research Symposium (ISDRS), 2011 International
         
        
            Conference_Location : 
College Park, MD
         
        
            Print_ISBN : 
978-1-4577-1755-0
         
        
        
            DOI : 
10.1109/ISDRS.2011.6135190