Title :
Reduced RC models for IC interconnections with coupling capacitances
Author :
van Genderen, A.J. ; Van Der Meijs, N.P.
Author_Institution :
Dept. of Electr. Eng., Delft Univ. of Technol., Netherlands
Abstract :
The transmission behavior of interconnections in integrated circuits is often determined by their distributed RC effects. The authors present a modeling technique, for incorporation in a layout-to-circuit extraction program, that accurately represents these effects. The method consists of first replacing IC interconnections by a complex RC network and then transforming this complex RC network into a simple RC network. It extends previous work in that (1) besides preserving the Elmore time constants between the terminals of the interconnections, the method also preserves the total resistances between the terminals and the total capacitances, and (2) the method handles ground capacitances as well as coupling capacitances
Keywords :
capacitance; circuit analysis computing; circuit layout CAD; delays; integrated circuit technology; Elmore time constants; IC interconnections; complex RC network; coupling capacitances; distributed RC effects; ground capacitances; layout-to-circuit extraction program; total capacitances; total resistances; Capacitance; Conducting materials; Conductivity; Conductors; Coupling circuits; Displays; Integrated circuit interconnections; Integrated circuit modeling; Integrated circuit technology;
Conference_Titel :
Design Automation, 1992. Proceedings., [3rd] European Conference on
Conference_Location :
Brussels
Print_ISBN :
0-8186-2645-3
DOI :
10.1109/EDAC.1992.205908