Ultrahigh sensitive plasmonic terahertz detector based on an asymmetric dual-grating gate HEMT structure

Author

Watanabe, Takayuki ; Tombet, Stephane Boubanba ; Tanimoto, Yudai ; Wang, Yuye ; Minamide, Hiroaki ; Ito, Hiromasa ; Fateev, Denis ; Popov, Viacheslav ; Coquillat, Dominique ; Knap, Wojciech ; Otsuji, Taiichi

Author_Institution

Rsch. Inst. Electr. Commun., Tohoku Univ., Sendai, Japan

fYear

2011

fDate

7-9 Dec. 2011

Firstpage

1

Lastpage

2

Abstract

We report on ultrahigh sensitive, broadband terahertz (THz) detectors based on asymmetric double-grating-gate (A-DGG) HEMTs demonstrating a record responsivity of 2.2 kV/W at 1 THz. Hydrodynamic nonlinearities of two-dimensional (2D) plasmons in high-electron-mobility transistors (HEMTs) are promising for fast and sensitive rectification/detection of THz radiation [1], which can be applied to real-time THz imaging/spectroscopic analysis and future THz wireless communications [2]. Recently, InP- and GaN-based HEMTs as well as Si-MOSFETs have demonstrated improved responsivities [3,4], approaching 1 kV/W at 1 THz by introducing narrow-band dipole antenna structure merged with the gate electrode [3].

Keywords

III-V semiconductors; MOSFET; dipole antennas; gallium compounds; high electron mobility transistors; indium compounds; plasmonics; plasmons; silicon; terahertz wave detectors; wide band gap semiconductors; 2D plasmons; A-DGG HEMT; GaN; InP; Si; THz imaging; THz radiation detection; THz radiation rectification; THz wireless communications; asymmetric dual-grating gate HEMT structure; broadband terahertz detectors; gate electrode; high-electron-mobility transistors; hydrodynamic nonlinearities; narrow-band dipole antenna structure; silicon MOSFET; spectroscopic analysis; two-dimensional plasmons; ultrahigh-sensitive plasmonic terahertz detector; Detectors; Educational institutions; Fingers; HEMTs; Logic gates; Plasmons; Voltage measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Semiconductor Device Research Symposium (ISDRS), 2011 International

Conference_Location

College Park, MD

Print_ISBN

978-1-4577-1755-0

Type

conf

DOI

10.1109/ISDRS.2011.6135193

Filename

6135193