• DocumentCode
    3098442
  • Title

    Graded silicon-germanium channel tunnel field effect transistor (G-TFET), an approach to increase ION without compromising IOFF

  • Author

    Goyal, Nitin ; Chaturvedi, Poornendu

  • Author_Institution
    Solid State Phys. Lab., Delhi, India
  • fYear
    2011
  • fDate
    7-9 Dec. 2011
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    In this paper, a new modified thin body double gate tunneling field effect transistor (G-TFET) on SOI with graded silicon germanium channel is proposed. Gradually changing Ge composition is used to achieve (i) reduced band gap, (ii) reduced barrier width, and (iii) enhanced accelerating intrinsic field, which enhances device performance parameters. Results show G-TFET with graded SiGe channel can be successfully employed for achieving significant increase in ON current without compromising OFF current.
  • Keywords
    Ge-Si alloys; energy gap; insulated gate field effect transistors; semiconductor materials; OFF current; ON current; SOI; SiGe; device performance parameter; graded silicon-germanium channel tunnel field effect transistor; reduced band gap; reduced barrier width; thin body double gate tunneling field effect transistor; Educational institutions; FETs; Logic gates; Performance evaluation; Photonic band gap; Silicon; Tunneling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Device Research Symposium (ISDRS), 2011 International
  • Conference_Location
    College Park, MD
  • Print_ISBN
    978-1-4577-1755-0
  • Type

    conf

  • DOI
    10.1109/ISDRS.2011.6135196
  • Filename
    6135196