DocumentCode
3098442
Title
Graded silicon-germanium channel tunnel field effect transistor (G-TFET), an approach to increase ION without compromising IOFF
Author
Goyal, Nitin ; Chaturvedi, Poornendu
Author_Institution
Solid State Phys. Lab., Delhi, India
fYear
2011
fDate
7-9 Dec. 2011
Firstpage
1
Lastpage
2
Abstract
In this paper, a new modified thin body double gate tunneling field effect transistor (G-TFET) on SOI with graded silicon germanium channel is proposed. Gradually changing Ge composition is used to achieve (i) reduced band gap, (ii) reduced barrier width, and (iii) enhanced accelerating intrinsic field, which enhances device performance parameters. Results show G-TFET with graded SiGe channel can be successfully employed for achieving significant increase in ON current without compromising OFF current.
Keywords
Ge-Si alloys; energy gap; insulated gate field effect transistors; semiconductor materials; OFF current; ON current; SOI; SiGe; device performance parameter; graded silicon-germanium channel tunnel field effect transistor; reduced band gap; reduced barrier width; thin body double gate tunneling field effect transistor; Educational institutions; FETs; Logic gates; Performance evaluation; Photonic band gap; Silicon; Tunneling;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Device Research Symposium (ISDRS), 2011 International
Conference_Location
College Park, MD
Print_ISBN
978-1-4577-1755-0
Type
conf
DOI
10.1109/ISDRS.2011.6135196
Filename
6135196
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