DocumentCode :
3098442
Title :
Graded silicon-germanium channel tunnel field effect transistor (G-TFET), an approach to increase ION without compromising IOFF
Author :
Goyal, Nitin ; Chaturvedi, Poornendu
Author_Institution :
Solid State Phys. Lab., Delhi, India
fYear :
2011
fDate :
7-9 Dec. 2011
Firstpage :
1
Lastpage :
2
Abstract :
In this paper, a new modified thin body double gate tunneling field effect transistor (G-TFET) on SOI with graded silicon germanium channel is proposed. Gradually changing Ge composition is used to achieve (i) reduced band gap, (ii) reduced barrier width, and (iii) enhanced accelerating intrinsic field, which enhances device performance parameters. Results show G-TFET with graded SiGe channel can be successfully employed for achieving significant increase in ON current without compromising OFF current.
Keywords :
Ge-Si alloys; energy gap; insulated gate field effect transistors; semiconductor materials; OFF current; ON current; SOI; SiGe; device performance parameter; graded silicon-germanium channel tunnel field effect transistor; reduced band gap; reduced barrier width; thin body double gate tunneling field effect transistor; Educational institutions; FETs; Logic gates; Performance evaluation; Photonic band gap; Silicon; Tunneling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Device Research Symposium (ISDRS), 2011 International
Conference_Location :
College Park, MD
Print_ISBN :
978-1-4577-1755-0
Type :
conf
DOI :
10.1109/ISDRS.2011.6135196
Filename :
6135196
Link To Document :
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