Title :
Graded silicon-germanium channel tunnel field effect transistor (G-TFET), an approach to increase ION without compromising IOFF
Author :
Goyal, Nitin ; Chaturvedi, Poornendu
Author_Institution :
Solid State Phys. Lab., Delhi, India
Abstract :
In this paper, a new modified thin body double gate tunneling field effect transistor (G-TFET) on SOI with graded silicon germanium channel is proposed. Gradually changing Ge composition is used to achieve (i) reduced band gap, (ii) reduced barrier width, and (iii) enhanced accelerating intrinsic field, which enhances device performance parameters. Results show G-TFET with graded SiGe channel can be successfully employed for achieving significant increase in ON current without compromising OFF current.
Keywords :
Ge-Si alloys; energy gap; insulated gate field effect transistors; semiconductor materials; OFF current; ON current; SOI; SiGe; device performance parameter; graded silicon-germanium channel tunnel field effect transistor; reduced band gap; reduced barrier width; thin body double gate tunneling field effect transistor; Educational institutions; FETs; Logic gates; Performance evaluation; Photonic band gap; Silicon; Tunneling;
Conference_Titel :
Semiconductor Device Research Symposium (ISDRS), 2011 International
Conference_Location :
College Park, MD
Print_ISBN :
978-1-4577-1755-0
DOI :
10.1109/ISDRS.2011.6135196