Title :
A physics of failure based qualification process for flexible display interconnect materials
Author :
Martin, Thomas ; Christou, Aris
Author_Institution :
L-3 Display Syst., Univ. of Maryland, College Park, MD, USA
Abstract :
The next paradigm shift in display technology involves making them flexible, bringing with it many challenges with respect to product reliability. To compound the problem, industry is continuously introducing novel materials and experimenting with device geometries to improve flexibility and optical performance. The changing landscape, makes it is imperative to have a qualification method that allows for a rapid assessment of design changes on reliability from a myriad of inter-related conditions. This investigation involves the development of a qualification process for interconnects used in flexible displays. It is the intention of this work to allow for a foundation for future research in this area.
Keywords :
failure analysis; flexible displays; optical interconnections; reliability; device geometry; display technology; failure based qualification process; flexible display interconnect material; interrelated condition; optical performance; product reliability; qualification process; Finite element methods; Indium tin oxide; Integrated circuit interconnections; Qualifications; Resistance; Stress; Substrates;
Conference_Titel :
Semiconductor Device Research Symposium (ISDRS), 2011 International
Conference_Location :
College Park, MD
Print_ISBN :
978-1-4577-1755-0
DOI :
10.1109/ISDRS.2011.6135213